Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition (ISBN-13: 9780306472923 and ISBN-10: 0306472929), written by authors Joseph Goldstein, Charles E. Lyman, Dale E. Newbury, Patrick Echlin, David C. Joy, Eric Lifshin, Linda Sawyer, J.R. Michael, was published by Springer in 2003. With an overall rating of 4.4 stars, it's a notable title among other Electrical & Electronics (Engineering, Electron Microscopy, Physics, Microscopy, Nanotechnology, Technology) books. You can easily purchase or rent Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition (Hardcover) from BooksRun, along with many other new and used Electrical & Electronics books and textbooks. And, if you're looking to sell your copy, our current buyback offer is $4.95.