Sell, buy or rent J.R. Michael textbooks
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
by
Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
ISBN-13: 9780306472923
ISBN-10: 0306472929
Edition: 3rd
Publication date: 2003
Publisher:
Springer
Format:
Hardcover
708 pages
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
by
Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
ISBN-13: 9781461349693
ISBN-10: 1461349699
Edition: 3rd ed. 2003. Softcover reprint of the original 3rd ed. 2003
Publication date: 2013
Publisher:
Springer
Format:
Paperback
708 pages