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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

by Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
ISBN-13: 9780306472923
ISBN-10: 0306472929
Edition: 3rd
Publication date: 2007
Publisher: Springer
Format: Hardcover 689 pages