Sell, buy or rent David C. Joy textbooks
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
by
Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
ISBN-13: 9780306472923
ISBN-10: 0306472929
Edition: 3rd
Publication date: 2007
Publisher:
Springer
Format:
Hardcover
689 pages
Scanning Electron Microscopy and X-Ray Microanalysis
by
Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy
ISBN-13: 9781493966745
ISBN-10: 149396674X
Edition: 4th ed. 2018
Publication date: 2017
Publisher:
Springer
Format:
Hardcover
550 pages