Sell, buy or rent David C. Joy textbooks
Scanning Electron Microscopy and X-Ray Microanalysis
by
Goldstein, Joseph I., Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W.M., Scott, John Henry J., Joy, David C.
ISBN-13: 9781493966745
ISBN-10: 149396674X
Edition: 4th ed. 2018
Publication date: 2017
Publisher:
Springer
Format:
Hardcover
573 pages
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
by
Goldstein, Joseph, Newbury, Dale E., Joy, David C., Lyman, Charles E., Echlin, Patrick, Lifshin, Eric, Sawyer, Linda, Michael, J.R.
ISBN-13: 9780306472923
ISBN-10: 0306472929
Edition: 3rd
Publication date: 2003
Publisher:
Springer
Format:
Hardcover
708 pages