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Scanning Electron Microscopy and X-ray Microanalysis: Third Edition

Scanning Electron Microscopy and X-ray Microanalysis: Third Edition
ISBN-13:
9780306472923
ISBN-10:
0306472929
Author:
Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
Edition:
3rd
Publication date:
2007
Publisher:
Springer
Format:
Hardcover 689 pages
Buy from $29.68

Scanning Electron Microscopy and X-Ray Microanalysis

Scanning Electron Microscopy and X-Ray Microanalysis
ISBN-13:
9781493966745
ISBN-10:
149396674X
Author:
Joseph Goldstein, Dale Newbury, David C. Joy, Joseph Michael, Nicholas W.M. Ritchie, John Henry Scott
Edition:
4th ed. 2017
Publication date:
2017
Publisher:
Springer
Format:
Hardcover 550 pages
Sell for $3.00
Buy from $53.81
eBook from $109.00