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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

by Goldstein, Joseph, Newbury, Dale E., Joy, David C., Lyman, Charles E., Echlin, Patrick, Lifshin, Eric, Sawyer, Linda, Michael, J.R.
ISBN-13: 9780306472923
ISBN-10: 0306472929
Edition: 3rd
Publication date: 2007
Publisher: Springer
Format: Hardcover 689 pages