Sell, buy or rent Dale E. Newbury textbooks

Scanning Electron Microscopy and X-Ray Microanalysis

by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy
ISBN-13: 9781493966745
ISBN-10: 149396674X
Edition: 4th ed. 2018
Publication date: 2017
Publisher: Springer
Format: Hardcover 573 pages

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists

by Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin
ISBN-13: 9780306407680
ISBN-10: 030640768X
Edition: 2
Publication date: 1981
Publisher: Springer
Format: Hardcover 673 pages

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists

by Joseph Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Alton D. Romig Jr., Charles E. Lyman, Charles Fiori, Eric Lifshin
ISBN-13: 9781461276531
ISBN-10: 1461276535
Edition: 2nd ed. 1992. Softcover reprint of the original 2nd ed. 1992
Publication date: 2011
Publisher: Springer
Format: Paperback 840 pages

Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

by Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
ISBN-13: 9780306472923
ISBN-10: 0306472929
Edition: 3rd
Publication date: 2003
Publisher: Springer
Format: Hardcover 708 pages

Scanning Electron Microscopy and X-Ray Microanalysis

by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy
ISBN-13: 9781493982691
ISBN-10: 1493982699
Edition: Softcover reprint of the original 4th ed. 2018
Publication date: 2018
Publisher: Springer
Format: Paperback 573 pages

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook

by Charles E. Lyman
ISBN-13: 9780306435911
ISBN-10: 0306435918
Edition: Softcover reprint of the original 1st ed. 1990
Publication date: 1990
Publisher: Springer
Format: Paperback 418 pages

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists

by Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy
ISBN-13: 9780306441752
ISBN-10: 0306441756
Edition: 2nd Edition
Publication date: 1992
Publisher: Springer
Format: Hardcover 840 pages

X-Ray Spectrometry in Electron Beam Instruments

by Joseph Goldstein, Dale E. Newbury, David B. Williams
ISBN-13: 9780306448584
ISBN-10: 0306448580
Edition: 1995
Publisher: Springer
Format: Hardcover 390 pages

Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

by Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
ISBN-13: 9781461349693
ISBN-10: 1461349699
Edition: 3rd ed. 2003. Softcover reprint of the original 3rd ed. 2003
Publication date: 2013
Publisher: Springer
Format: Paperback 708 pages

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

by Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury
ISBN-13: 9780306421402
ISBN-10: 0306421402
Edition: 1986
Publisher: Plenum Press
Format: Hardcover 466 pages