9780306421402-0306421402-Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

ISBN-13: 9780306421402
ISBN-10: 0306421402
Edition: 1986
Author: Joseph Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, C.E. Fiori
Publication date: 1986
Publisher: Plenum Press
Format: Hardcover 466 pages
FREE US shipping

Book details

ISBN-13: 9780306421402
ISBN-10: 0306421402
Edition: 1986
Author: Joseph Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, C.E. Fiori
Publication date: 1986
Publisher: Plenum Press
Format: Hardcover 466 pages

Summary

Advanced Scanning Electron Microscopy and X-Ray Microanalysis (ISBN-13: 9780306421402 and ISBN-10: 0306421402), written by authors Joseph Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, C.E. Fiori, was published by Plenum Press in 1986. With an overall rating of 4.2 stars, it's a notable title among other books. You can easily purchase or rent Advanced Scanning Electron Microscopy and X-Ray Microanalysis (Hardcover) from BooksRun, along with many other new and used books and textbooks. And, if you're looking to sell your copy, our current buyback offer is $0.6.

Description

This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.

Rate this book Rate this book

We would LOVE it if you could help us and other readers by reviewing the book