Design, Analysis and Test of Logic Circuits Under Uncertainty (Lecture Notes in Electrical Engineering, 115)

Design, Analysis and Test of Logic Circuits Under Uncertainty (Lecture Notes in Electrical Engineering, 115) (ISBN-13: 9789400797987 and ISBN-10: 9400797982), written by authors John P. Hayes, Igor L. Markov, Smita Krishnaswamy, was published by Springer in 2014. With an overall rating of 3.8 stars, it's a notable title among other books. You can easily purchase or rent Design, Analysis and Test of Logic Circuits Under Uncertainty (Lecture Notes in Electrical Engineering, 115) (Paperback) from BooksRun, along with many other new and used books and textbooks. And, if you're looking to sell your copy, our current buyback offer is $0.3.