Design, Analysis and Test of Logic Circuits Under Uncertainty (Lecture Notes in Electrical Engineering, 115)
ISBN-13:
9789048196432
ISBN-10:
9048196434
Edition:
2013
Author:
Publication date:
2012
Publisher:
Springer
Format:
Hardcover
136 pages
FREE US shipping
Book details
ISBN-13:
9789048196432
ISBN-10:
9048196434
Edition:
2013
Author:
Publication date:
2012
Publisher:
Springer
Format:
Hardcover
136 pages
Summary
Design, Analysis and Test of Logic Circuits Under Uncertainty (Lecture Notes in Electrical Engineering, 115) (ISBN-13: 9789048196432 and ISBN-10: 9048196434), written by authors
, was published by Springer in 2012.
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Description
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
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