Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford ... 1979 (Springer Series in Chemical Physics, 9)

Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford ... 1979 (Springer Series in Chemical Physics, 9) (ISBN-13: 9783642618734 and ISBN-10: 3642618731), written by authors A. Benninghoven, C.A. Jr. Evans, R.A. Powell, R. Shimizu, H.A. Storms, was published by Springer in 2011. With an overall rating of 4.1 stars, it's a notable title among other Photography & Video (Analytic, Chemistry, Industrial & Technical, Electromagnetism, Physics, Solid-State Physics) books. You can easily purchase or rent Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford ... 1979 (Springer Series in Chemical Physics, 9) (Paperback) from BooksRun, along with many other new and used Photography & Video books and textbooks. And, if you're looking to sell your copy, our current buyback offer is $0.3.