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9783642618734-3642618731-Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford ... 1979 (Springer Series in Chemical Physics, 9)
9783642618734-3642618731-Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford ... 1979 (Springer Series in Chemical Physics, 9)

Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford ... 1979 (Springer Series in Chemical Physics, 9)

by A. Benninghoven, C.A. Jr. Evans, R.A. Powell, R. Shimizu, H.A. Storms
ISBN-13: 9783642618734
ISBN-10: 3642618731
Edition: Softcover reprint of the original 1st ed. 1979
Publication date: 2011
Publisher: Springer
Format: Paperback 314 pages
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