Semiconductor Memories: Technology, Testing, and Reliability
ISBN-13:
9780780310001
ISBN-10:
0780310004
Edition:
1
Author:
Ashok K. Sharma
Publication date:
2002
Publisher:
Wiley-IEEE Press
Format:
Hardcover
480 pages
Category:
Computer Science
,
Telecommunications & Sensors
,
Engineering
FREE US shipping
Book details
ISBN-13:
9780780310001
ISBN-10:
0780310004
Edition:
1
Author:
Ashok K. Sharma
Publication date:
2002
Publisher:
Wiley-IEEE Press
Format:
Hardcover
480 pages
Category:
Computer Science
,
Telecommunications & Sensors
,
Engineering
Summary
Semiconductor Memories: Technology, Testing, and Reliability (ISBN-13: 9780780310001 and ISBN-10: 0780310004), written by authors
Ashok K. Sharma, was published by Wiley-IEEE Press in 2002.
With an overall rating of 3.6 stars, it's a notable title among other
Computer Science
(Telecommunications & Sensors, Engineering) books. You can easily purchase or rent Semiconductor Memories: Technology, Testing, and Reliability (Hardcover) from BooksRun,
along with many other new and used
Computer Science
books
and textbooks.
And, if you're looking to sell your copy, our current buyback offer is $0.3.
Description
Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.
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