Testing Semiconductor Memories: Theory and Practice
ISBN-13:
9780471925866
ISBN-10:
0471925861
Edition:
Reprint with Corrections
Author:
A. J. Van De Goor
Publication date:
1998
Publisher:
John Wiley & Sons Inc
Format:
Hardcover
512 pages
Category:
Electrical & Electronics
,
Engineering
FREE US shipping
Book details
ISBN-13:
9780471925866
ISBN-10:
0471925861
Edition:
Reprint with Corrections
Author:
A. J. Van De Goor
Publication date:
1998
Publisher:
John Wiley & Sons Inc
Format:
Hardcover
512 pages
Category:
Electrical & Electronics
,
Engineering
Summary
Testing Semiconductor Memories: Theory and Practice (ISBN-13: 9780471925866 and ISBN-10: 0471925861), written by authors
A. J. Van De Goor, was published by John Wiley & Sons Inc in 1998.
With an overall rating of 3.7 stars, it's a notable title among other
Electrical & Electronics
(Engineering) books. You can easily purchase or rent Testing Semiconductor Memories: Theory and Practice (Hardcover) from BooksRun,
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Description
Goor (EE, Delft U.) presents memory test models on the chip, array, and board level. For each a class of fault models is introduced together with opposite tests. He particularly stresses the appropriateness of fault models to their class. Annotation copyright Book News, Inc. Portland, Or.
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