Advances in X-Ray Analysis, Vol. 35
ISBN-13:
9780306442490
ISBN-10:
0306442493
Edition:
1
Author:
Ron Jenkins, John V. Gilfrich, Ting C. Huang, Deane K. Smith, Paul K. Predecki, C.S. Barrett, G.J. McCarthy, R. Ryon
Publication date:
1992
Publisher:
Springer
Format:
Hardcover
1334 pages
FREE US shipping
Book details
ISBN-13:
9780306442490
ISBN-10:
0306442493
Edition:
1
Author:
Ron Jenkins, John V. Gilfrich, Ting C. Huang, Deane K. Smith, Paul K. Predecki, C.S. Barrett, G.J. McCarthy, R. Ryon
Publication date:
1992
Publisher:
Springer
Format:
Hardcover
1334 pages
Summary
Advances in X-Ray Analysis, Vol. 35 (ISBN-13: 9780306442490 and ISBN-10: 0306442493), written by authors
Ron Jenkins, John V. Gilfrich, Ting C. Huang, Deane K. Smith, Paul K. Predecki, C.S. Barrett, G.J. McCarthy, R. Ryon, was published by Springer in 1992.
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Description
The proceedings of the combined First Pacific-International Congress on X-Ray Analytical Methods (PICXAM) and Fortieth Annual Conference on Applications of X-Ray Analysis, held in Hilo and Honolulu Hawaii, August 1991, comprise reports on the latest developments in international research on X-ray fl
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