Sell, buy or rent G.J. McCarthy textbooks
Advances in X-Ray Analysis, Vol. 35
by
C.S. Barrett, John V. Gilfrich, Ting C. Huang, Ron Jenkins, G.J. McCarthy, Paul K. Predecki, R. Ryon, Deane K. Smith
ISBN-13: 9780306442490
ISBN-10: 0306442493
Edition: 1
Publication date: 1992
Publisher:
Springer
Format:
Hardcover
1334 pages