9788173195778-8173195773-Industrial Mathematics

Industrial Mathematics

ISBN-13: 9788173195778
ISBN-10: 8173195773
Author: M. C. Joshi, A.K. Pani, S.V. Sabnis
Publication date: 2006
Publisher: Narosa Publishing House
Format: Hardcover 524 pages
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Book details

ISBN-13: 9788173195778
ISBN-10: 8173195773
Author: M. C. Joshi, A.K. Pani, S.V. Sabnis
Publication date: 2006
Publisher: Narosa Publishing House
Format: Hardcover 524 pages

Summary

Industrial Mathematics (ISBN-13: 9788173195778 and ISBN-10: 8173195773), written by authors M. C. Joshi, A.K. Pani, S.V. Sabnis, was published by Narosa Publishing House in 2006. With an overall rating of 3.9 stars, it's a notable title among other books. You can easily purchase or rent Industrial Mathematics (Hardcover) from BooksRun, along with many other new and used books and textbooks. And, if you're looking to sell your copy, our current buyback offer is $0.3.

Description

This book contains results of recent research interests concerning solution strategies employed for solving real life problems pertaining to Modelling & Scientific Computing, Control & Optimizations and Financial Mathematics. * Modelling of volcanic lava flows, microwave heating, flow inside an industrial transport blower, slurry phase reactor for Fisher-Tropsch synthesis, ice in transmission lines * Numerical solutions of 3-D unsteady flow dynamics in a vessel with aneurysm, viscoelastic contraction fluid flows, anisotropic plate bending problems using mixed FEM, elliptic problems by employing parallel spectral method, Stefan problem, Fisher-Kolmogorov equation * Optimal sizing and shape optimization in injection moulding process, design optimization of an aircraft wing, control strategies in the transmission of malaria * A decision model for natural oil buying policy and numerical simulation for valuation of American options on stocks * A new predictive classifier in data mining, a novel partition approach in large data sets, and task allocation problem * The process of adhesive contact of membranes and beams, variational characterization of resonant states in integrated optical devices, and estimation of windowing errors in the wavelet based reconstruction in tomography.

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