Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45)
ISBN-13:
9783642083723
ISBN-10:
3642083722
Author:
Ludwig Reimer, P.W. Hawkes
Publication date:
2010
Publisher:
Springer
Format:
Paperback
543 pages
Category:
Chemistry
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Book details
ISBN-13:
9783642083723
ISBN-10:
3642083722
Author:
Ludwig Reimer, P.W. Hawkes
Publication date:
2010
Publisher:
Springer
Format:
Paperback
543 pages
Category:
Chemistry
Summary
Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45) (ISBN-13: 9783642083723 and ISBN-10: 3642083722), written by authors
Ludwig Reimer, P.W. Hawkes, was published by Springer in 2010.
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Description
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
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