Fundamentals of Electromigration-Aware Integrated Circuit Design
ISBN-13:
9783319735573
ISBN-10:
3319735578
Edition:
1st ed. 2018
Author:
Lienig
Publication date:
2018
Publisher:
Springer
Format:
Hardcover
176 pages
Category:
Mainframes & Minicomputers
,
Hardware & DIY
FREE US shipping
Book details
ISBN-13:
9783319735573
ISBN-10:
3319735578
Edition:
1st ed. 2018
Author:
Lienig
Publication date:
2018
Publisher:
Springer
Format:
Hardcover
176 pages
Category:
Mainframes & Minicomputers
,
Hardware & DIY
Summary
Fundamentals of Electromigration-Aware Integrated Circuit Design (ISBN-13: 9783319735573 and ISBN-10: 3319735578), written by authors
Lienig, was published by Springer in 2018.
With an overall rating of 4.0 stars, it's a notable title among other
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Description
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration’s negative impact on circuit reliability.
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