9783319216676-3319216678-Computer Aided Verification: 27th International Conference, CAV 2015, San Francisco, CA, USA, July 18-24, 2015, Proceedings, Part II (Lecture Notes in Computer Science, 9207)

Computer Aided Verification: 27th International Conference, CAV 2015, San Francisco, CA, USA, July 18-24, 2015, Proceedings, Part II (Lecture Notes in Computer Science, 9207)

ISBN-13: 9783319216676
ISBN-10: 3319216678
Edition: 1st ed. 2015
Author: Daniel Kroening, Corina S. Păsăreanu
Publication date: 2015
Publisher: Springer
Format: Paperback 487 pages
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Book details

ISBN-13: 9783319216676
ISBN-10: 3319216678
Edition: 1st ed. 2015
Author: Daniel Kroening, Corina S. Păsăreanu
Publication date: 2015
Publisher: Springer
Format: Paperback 487 pages

Summary

Computer Aided Verification: 27th International Conference, CAV 2015, San Francisco, CA, USA, July 18-24, 2015, Proceedings, Part II (Lecture Notes in Computer Science, 9207) (ISBN-13: 9783319216676 and ISBN-10: 3319216678), written by authors Daniel Kroening, Corina S. Păsăreanu, was published by Springer in 2015. With an overall rating of 3.6 stars, it's a notable title among other books. You can easily purchase or rent Computer Aided Verification: 27th International Conference, CAV 2015, San Francisco, CA, USA, July 18-24, 2015, Proceedings, Part II (Lecture Notes in Computer Science, 9207) (Paperback) from BooksRun, along with many other new and used books and textbooks. And, if you're looking to sell your copy, our current buyback offer is $0.6.

Description

The two-volume set LNCS 9206 and LNCS 9207 constitutes the refereed proceedings of the 27th International Conference on Computer Aided Verification, CAV 2015, held in San Francisco, CA, USA, in July 2015.

The total of 58 full and 11 short papers presented in the proceedings was carefully reviewed and selected from 252 submissions. The papers were organized in topical sections named: model checking and refinements; quantitative reasoning; software analysis; lightning talks; interpolation, IC3/PDR, and Invariants; SMT techniques and applications; HW verification; synthesis; termination; and concurrency.

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