9781848167896-184816789X-SCANNING TRANSMISSION ELECTRON MICROSCOPY OF NANOMATERIALS: BASICS OF IMAGING AND ANALYSIS

SCANNING TRANSMISSION ELECTRON MICROSCOPY OF NANOMATERIALS: BASICS OF IMAGING AND ANALYSIS

ISBN-13: 9781848167896
ISBN-10: 184816789X
Author: Nobuo Tanaka
Publication date: 2014
Publisher: Imperial College Pr
Format: Hardcover 571 pages
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Book details

ISBN-13: 9781848167896
ISBN-10: 184816789X
Author: Nobuo Tanaka
Publication date: 2014
Publisher: Imperial College Pr
Format: Hardcover 571 pages

Summary

SCANNING TRANSMISSION ELECTRON MICROSCOPY OF NANOMATERIALS: BASICS OF IMAGING AND ANALYSIS (ISBN-13: 9781848167896 and ISBN-10: 184816789X), written by authors Nobuo Tanaka, was published by Imperial College Pr in 2014. With an overall rating of 4.3 stars, it's a notable title among other Materials & Material Science (Electron Microscopy, Physics, Mechanics, Nanostructures, Optics, Engineering) books. You can easily purchase or rent SCANNING TRANSMISSION ELECTRON MICROSCOPY OF NANOMATERIALS: BASICS OF IMAGING AND ANALYSIS (Hardcover) from BooksRun, along with many other new and used Materials & Material Science books and textbooks. And, if you're looking to sell your copy, our current buyback offer is $0.3.

Description

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.

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