9781475710571-1475710577-Low-Power Deep Sub-Micron CMOS Logic: Sub-threshold Current Reduction (The Springer International Series in Engineering and Computer Science, 841)

Low-Power Deep Sub-Micron CMOS Logic: Sub-threshold Current Reduction (The Springer International Series in Engineering and Computer Science, 841)

ISBN-13: 9781475710571
ISBN-10: 1475710577
Edition: Softcover reprint of the original 1st ed. 2004
Author: Arthur H.M. van Roermund, P. van der Meer, A. van Staveren
Publication date: 2012
Publisher: Springer
Format: Paperback 168 pages
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Book details

ISBN-13: 9781475710571
ISBN-10: 1475710577
Edition: Softcover reprint of the original 1st ed. 2004
Author: Arthur H.M. van Roermund, P. van der Meer, A. van Staveren
Publication date: 2012
Publisher: Springer
Format: Paperback 168 pages

Summary

Low-Power Deep Sub-Micron CMOS Logic: Sub-threshold Current Reduction (The Springer International Series in Engineering and Computer Science, 841) (ISBN-13: 9781475710571 and ISBN-10: 1475710577), written by authors Arthur H.M. van Roermund, P. van der Meer, A. van Staveren, was published by Springer in 2012. With an overall rating of 4.3 stars, it's a notable title among other books. You can easily purchase or rent Low-Power Deep Sub-Micron CMOS Logic: Sub-threshold Current Reduction (The Springer International Series in Engineering and Computer Science, 841) (Paperback) from BooksRun, along with many other new and used books and textbooks. And, if you're looking to sell your copy, our current buyback offer is $0.3.

Description

1. 1 Power-dissipation trends in CMOS circuits Shrinking device geometry, growing chip area and increased data-processing speed performance are technological trends in the integrated circuit industry to enlarge chip functionality. Already in 1965 Gordon Moore predicted that the total number of devices on a chip would double every year until the 1970s and every 24 months in the 1980s. This prediction is widely known as "Moore's Law" and eventually culminated in the Semiconductor Industry Association (SIA) technology road map [1]. The SIA road map has been a guide for the in­ dustry leading them to continued wafer and die size growth, increased transistor density and operating frequencies, and defect density reduction. To mention a few numbers; the die size increased 7% per year, the smallest feature sizes decreased 30% and the operating frequencies doubled every two years. As a consequence of these trends both the number of transistors and the power dissi­ pation per unit area increase. In the near future the maximum power dissipation per unit area will be reached. Down-scaling of the supply voltage is not only the most effective way to reduce power dissipation in general it also is a necessary precondition to ensure device reliability by reducing electrical fields and device temperature, to prevent device degradation. A draw-back of this solution is an increased signal propa­ gation delay, which results in a lower data-processing speed performance.
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