9781441965677-144196567X-Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy

Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy

ISBN-13: 9781441965677
ISBN-10: 144196567X
Edition: 2011
Author: Sergei V Kalinin, Alexei Gruverman
Publication date: 2010
Publisher: Springer
Format: Hardcover 573 pages
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Book details

ISBN-13: 9781441965677
ISBN-10: 144196567X
Edition: 2011
Author: Sergei V Kalinin, Alexei Gruverman
Publication date: 2010
Publisher: Springer
Format: Hardcover 573 pages

Summary

Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy (ISBN-13: 9781441965677 and ISBN-10: 144196567X), written by authors Sergei V Kalinin, Alexei Gruverman, was published by Springer in 2010. With an overall rating of 3.8 stars, it's a notable title among other Materials & Material Science (Chemistry, Electron Microscopy, Physics, Optics, Solid-State Physics, Engineering) books. You can easily purchase or rent Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy (Hardcover) from BooksRun, along with many other new and used Materials & Material Science books and textbooks. And, if you're looking to sell your copy, our current buyback offer is $0.3.

Description

The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.

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