9781402093647-1402093640-Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, 32)

Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, 32)

ISBN-13: 9781402093647
ISBN-10: 1402093640
Edition: 2009
Author: Igor L. Markov, Kai-hui Chang, Valeria Bertacco
Publication date: 2008
Publisher: Springer
Format: Hardcover 224 pages
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Book details

ISBN-13: 9781402093647
ISBN-10: 1402093640
Edition: 2009
Author: Igor L. Markov, Kai-hui Chang, Valeria Bertacco
Publication date: 2008
Publisher: Springer
Format: Hardcover 224 pages

Summary

Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, 32) (ISBN-13: 9781402093647 and ISBN-10: 1402093640), written by authors Igor L. Markov, Kai-hui Chang, Valeria Bertacco, was published by Springer in 2008. With an overall rating of 3.5 stars, it's a notable title among other Drafting & Presentation (Architecture, Computer Science) books. You can easily purchase or rent Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, 32) (Hardcover) from BooksRun, along with many other new and used Drafting & Presentation books and textbooks. And, if you're looking to sell your copy, our current buyback offer is $0.3.

Description

Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
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