Reliability, Packaging, Testing, and Characterization of Mems/ Moems VI (Proceedings of Spie)

Reliability, Packaging, Testing, and Characterization of Mems/ Moems VI (Proceedings of Spie) (ISBN-13: 9780819465764 and ISBN-10: 0819465763), written by authors Allyson L. Hartzell, Rajeshuni Ramesham, was published by Society of Photo Optical in 2007. With an overall rating of 3.7 stars, it's a notable title among other books. You can easily purchase or rent Reliability, Packaging, Testing, and Characterization of Mems/ Moems VI (Proceedings of Spie) (Paperback) from BooksRun, along with many other new and used books and textbooks. And, if you're looking to sell your copy, our current buyback offer is $0.34.