9780817642099-0817642099-Goodness-of-Fit Tests and Model Validity (Statistics for Industry and Technology)

Goodness-of-Fit Tests and Model Validity (Statistics for Industry and Technology)

ISBN-13: 9780817642099
ISBN-10: 0817642099
Edition: 2002
Author: N. Balakrishnan, C. Huber-Carol, M. Nikulin, M. Mesbah
Publication date: 2002
Publisher: Birkhäuser
Format: Hardcover 542 pages
Category: Engineering
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Book details

ISBN-13: 9780817642099
ISBN-10: 0817642099
Edition: 2002
Author: N. Balakrishnan, C. Huber-Carol, M. Nikulin, M. Mesbah
Publication date: 2002
Publisher: Birkhäuser
Format: Hardcover 542 pages
Category: Engineering

Summary

Goodness-of-Fit Tests and Model Validity (Statistics for Industry and Technology) (ISBN-13: 9780817642099 and ISBN-10: 0817642099), written by authors N. Balakrishnan, C. Huber-Carol, M. Nikulin, M. Mesbah, was published by Birkhäuser in 2002. With an overall rating of 4.5 stars, it's a notable title among other Engineering books. You can easily purchase or rent Goodness-of-Fit Tests and Model Validity (Statistics for Industry and Technology) (Hardcover) from BooksRun, along with many other new and used Engineering books and textbooks. And, if you're looking to sell your copy, our current buyback offer is $0.3.

Description

The 37 expository articles in this volume provide broad coverage of important topics relating to the theory, methods, and applications of goodness-of-fit tests and model validity. The book is divided into eight parts, each of which presents topics written by expert researchers in their areas. Key features include: * state-of-the-art exposition of modern model validity methods, graphical techniques, and computer-intensive methods * systematic presentation with sufficient history and coverage of the fundamentals of the subject * exposure to recent research and a variety of open problems * many interesting real life examples for practitioners * extensive bibliography, with special emphasis on recent literature * subject index This comprehensive reference work will serve the statistical and applied mathematics communities as well as practitioners in the field.

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