9780817640415-081764041X-Scan Statistics and Applications (Statistics for Industry and Technology)

Scan Statistics and Applications (Statistics for Industry and Technology)

ISBN-13: 9780817640415
ISBN-10: 081764041X
Edition: 1999
Author: N. Balakrishnan, Joseph Glaz
Publication date: 1999
Publisher: Birkhäuser
Format: Hardcover 345 pages
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Book details

ISBN-13: 9780817640415
ISBN-10: 081764041X
Edition: 1999
Author: N. Balakrishnan, Joseph Glaz
Publication date: 1999
Publisher: Birkhäuser
Format: Hardcover 345 pages

Summary

Scan Statistics and Applications (Statistics for Industry and Technology) (ISBN-13: 9780817640415 and ISBN-10: 081764041X), written by authors N. Balakrishnan, Joseph Glaz, was published by Birkhäuser in 1999. With an overall rating of 3.9 stars, it's a notable title among other books. You can easily purchase or rent Scan Statistics and Applications (Statistics for Industry and Technology) (Hardcover) from BooksRun, along with many other new and used books and textbooks. And, if you're looking to sell your copy, our current buyback offer is $0.3.

Description

The study of scan statistics and their applications to many different scientific and engineering problems have received considerable attention in the literature recently. In addition to challenging theoretical problems, the area of scan statis tics has also found exciting applications in diverse disciplines such as archaeol ogy, astronomy, epidemiology, geography, material science, molecular biology, reconnaissance, reliability and quality control, sociology, and telecommunica tion. This will be clearly evident when one goes through this volume. In this volume, we have brought together a collection of experts working in this area of research in order to review some of the developments that have taken place over the years and also to present their new works and point out some open problems. With this in mind, we selected authors for this volume with some having theoretical interests and others being primarily concerned with applications of scan statistics. Our sincere hope is that this volume will thus provide a comprehensive survey of all the developments in this area of research and hence will serve as a valuable source as well as reference for theoreticians and applied researchers. Graduate students interested in this area will find this volume to be particularly useful as it points out many open challenging problems that they could pursue. This volume will also be appropriate for teaching a graduate-level special course on this topic.

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