9780750302562-0750302569-Quantitative Microbeam Analysis: Proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992. A NATO Advanced Study Institute. (Scottish Graduate Series)

Quantitative Microbeam Analysis: Proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992. A NATO Advanced Study Institute. (Scottish Graduate Series)

ISBN-13: 9780750302562
ISBN-10: 0750302569
Edition: 1
Author: A.G Fitzgerald
Publication date: 1993
Publisher: CRC Press
Format: Hardcover 350 pages
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Book details

ISBN-13: 9780750302562
ISBN-10: 0750302569
Edition: 1
Author: A.G Fitzgerald
Publication date: 1993
Publisher: CRC Press
Format: Hardcover 350 pages

Summary

Quantitative Microbeam Analysis: Proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992. A NATO Advanced Study Institute. (Scottish Graduate Series) (ISBN-13: 9780750302562 and ISBN-10: 0750302569), written by authors A.G Fitzgerald, was published by CRC Press in 1993. With an overall rating of 3.7 stars, it's a notable title among other Engineering (Electron Microscopy, Physics, Light, Molecular Physics) books. You can easily purchase or rent Quantitative Microbeam Analysis: Proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992. A NATO Advanced Study Institute. (Scottish Graduate Series) (Hardcover) from BooksRun, along with many other new and used Engineering books and textbooks. And, if you're looking to sell your copy, our current buyback offer is $0.3.

Description

Quantitative Microbeam Analysis provides a comprehensive introduction to the field of quantitative microbeam analysis (MQA). MQA is a technique used to analyze subatomic quantities of materials blasted from a surface by a laser or particle beam, providing information on the structure and composition of the material. Contributed to by international experts, the book is unique in the breadth of microbeam analytical techniques covered. For each technique, it develops the theoretical background, discusses practical details relating to choice of equipment, and describes the current advances. The book highlights developments relating to Auger electron spectroscopy in scanning electron microscopes and transmission electron microscopes and advances in surface analytical imaging and accelerated ion beam-surface interactions.

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