9780691044286-0691044287-Modern Methods in Complex Analysis

Modern Methods in Complex Analysis

ISBN-13: 9780691044286
ISBN-10: 0691044287
Edition: First Edition
Author: John P. DAngelo, Yum-Tong Siu, Thomas Bloom, David W. Catlin
Publication date: 1995
Publisher: Princeton University Press
Format: Paperback 360 pages
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ISBN-13: 9780691044286
ISBN-10: 0691044287
Edition: First Edition
Author: John P. DAngelo, Yum-Tong Siu, Thomas Bloom, David W. Catlin
Publication date: 1995
Publisher: Princeton University Press
Format: Paperback 360 pages

Summary

Modern Methods in Complex Analysis (ISBN-13: 9780691044286 and ISBN-10: 0691044287), written by authors John P. DAngelo, Yum-Tong Siu, Thomas Bloom, David W. Catlin, was published by Princeton University Press in 1995. With an overall rating of 3.6 stars, it's a notable title among other books. You can easily purchase or rent Modern Methods in Complex Analysis (Paperback) from BooksRun, along with many other new and used books and textbooks. And, if you're looking to sell your copy, our current buyback offer is $0.3.

Description

The fifteen articles composing this volume focus on recent developments in complex analysis. Written by well-known researchers in complex analysis and related fields, they cover a wide spectrum of research using the methods of partial differential equations as well as differential and algebraic geometry. The topics include invariants of manifolds, the complex Neumann problem, complex dynamics, Ricci flows, the Abel-Radon transforms, the action of the Ricci curvature operator, locally symmetric manifolds, the maximum principle, very ampleness criterion, integrability of elliptic systems, and contact geometry. Among the contributions are survey articles, which are especially suitable for readers looking for a comprehensive, well-presented introduction to the most recent important developments in the field.


The contributors are R. Bott, M. Christ, J. P. D'Angelo, P. Eyssidieux, C. Fefferman, J. E. Fornaess, H. Grauert, R. S. Hamilton, G. M. Henkin, N. Mok, A. M. Nadel, L. Nirenberg, N. Sibony, Y.-T. Siu, F. Treves, and S. M. Webster.

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