9780387915173-0387915176-INTRODUCTION TO SCANNING TRANS (Microscopy Handbooks (BIOS), 39)

INTRODUCTION TO SCANNING TRANS (Microscopy Handbooks (BIOS), 39)

ISBN-13: 9780387915173
ISBN-10: 0387915176
Edition: 1998
Author: P. GOODHEW, J. KEYSE, G. LORIMER, A. GARRETT-REED
Publication date: 1998
Publisher: BIOS Scientific Publishers
Format: Paperback 114 pages
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Book details

ISBN-13: 9780387915173
ISBN-10: 0387915176
Edition: 1998
Author: P. GOODHEW, J. KEYSE, G. LORIMER, A. GARRETT-REED
Publication date: 1998
Publisher: BIOS Scientific Publishers
Format: Paperback 114 pages

Summary

INTRODUCTION TO SCANNING TRANS (Microscopy Handbooks (BIOS), 39) (ISBN-13: 9780387915173 and ISBN-10: 0387915176), written by authors P. GOODHEW, J. KEYSE, G. LORIMER, A. GARRETT-REED, was published by BIOS Scientific Publishers in 1998. With an overall rating of 4.1 stars, it's a notable title among other books. You can easily purchase or rent INTRODUCTION TO SCANNING TRANS (Microscopy Handbooks (BIOS), 39) (Paperback) from BooksRun, along with many other new and used books and textbooks. And, if you're looking to sell your copy, our current buyback offer is $0.52.

Description

This useful resource provides a timely and comprehensive review of STE M, a subject of growing interest to many microscopists, and is ideal f or anyone seeking an introductory but complete explication of STEM. Th e authors' combined wealth of experience and the extensive examples pr ovided make it an excellent reference. Topics covered include: why STE M?, the instrument, the specimen, imaging with the STEM, diffraction w ith the STEM, analysis with STEM, chemical imaging, advanced STEM, and the limits of STEM.

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