9780306449994-0306449994-Quantum Transport in Ultrasmall Devices: Proceedings of a NATO Advanced Study Institute on Quantum Transport in Ultrasmall Devices, held July 17–30, ... Ciocco, Italy (NATO Science Series B:, 342)

Quantum Transport in Ultrasmall Devices: Proceedings of a NATO Advanced Study Institute on Quantum Transport in Ultrasmall Devices, held July 17–30, ... Ciocco, Italy (NATO Science Series B:, 342)

ISBN-13: 9780306449994
ISBN-10: 0306449994
Edition: 1995
Author: David K. Ferry, Harold L. Grubin, Carlo Jacoboni, A.-P. Jauho
Publication date: 1995
Publisher: Springer
Format: Hardcover 554 pages
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Book details

ISBN-13: 9780306449994
ISBN-10: 0306449994
Edition: 1995
Author: David K. Ferry, Harold L. Grubin, Carlo Jacoboni, A.-P. Jauho
Publication date: 1995
Publisher: Springer
Format: Hardcover 554 pages

Summary

Quantum Transport in Ultrasmall Devices: Proceedings of a NATO Advanced Study Institute on Quantum Transport in Ultrasmall Devices, held July 17–30, ... Ciocco, Italy (NATO Science Series B:, 342) (ISBN-13: 9780306449994 and ISBN-10: 0306449994), written by authors David K. Ferry, Harold L. Grubin, Carlo Jacoboni, A.-P. Jauho, was published by Springer in 1995. With an overall rating of 3.7 stars, it's a notable title among other books. You can easily purchase or rent Quantum Transport in Ultrasmall Devices: Proceedings of a NATO Advanced Study Institute on Quantum Transport in Ultrasmall Devices, held July 17–30, ... Ciocco, Italy (NATO Science Series B:, 342) (Hardcover) from BooksRun, along with many other new and used books and textbooks. And, if you're looking to sell your copy, our current buyback offer is $0.3.

Description

The operation of semiconductor devices depends upon the use of electrical potential barriers (such as gate depletion) in controlling the carrier densities (electrons and holes) and their transport. Although a successful device design is quite complicated and involves many aspects, the device engineering is mostly to devise a "best" device design by defIning optimal device structures and manipulating impurity profIles to obtain optimal control of the carrier flow through the device. This becomes increasingly diffIcult as the device scale becomes smaller and smaller. Since the introduction of integrated circuits, the number of individual transistors on a single chip has doubled approximately every three years. As the number of devices has grown, the critical dimension of the smallest feature, such as a gate length (which is related to the transport length defIning the channel), has consequently declined. The reduction of this design rule proceeds approximately by a factor of 1. 4 each generation, which means we will be using 0. 1-0. 15 ). lm rules for the 4 Gb chips a decade from now. If we continue this extrapolation, current technology will require 30 nm design rules, and a cell 3 2 size

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