9780123979001-0123979005-The Epidemiology of Plasmodium Vivax: History, Hiatus and Hubris (Volume 80) (Advances in Parasitology, Volume 80)

The Epidemiology of Plasmodium Vivax: History, Hiatus and Hubris (Volume 80) (Advances in Parasitology, Volume 80)

ISBN-13: 9780123979001
ISBN-10: 0123979005
Edition: 1
Author: Ric Price, J. Kevin Baird, S.I. Hay
Publication date: 2013
Publisher: Academic Press
Format: Hardcover 368 pages
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Book details

ISBN-13: 9780123979001
ISBN-10: 0123979005
Edition: 1
Author: Ric Price, J. Kevin Baird, S.I. Hay
Publication date: 2013
Publisher: Academic Press
Format: Hardcover 368 pages

Summary

The Epidemiology of Plasmodium Vivax: History, Hiatus and Hubris (Volume 80) (Advances in Parasitology, Volume 80) (ISBN-13: 9780123979001 and ISBN-10: 0123979005), written by authors Ric Price, J. Kevin Baird, S.I. Hay, was published by Academic Press in 2013. With an overall rating of 4.0 stars, it's a notable title among other Biology (Molecular Biology, Evolution, Immunology, Basic Medical Sciences, Biological Sciences) books. You can easily purchase or rent The Epidemiology of Plasmodium Vivax: History, Hiatus and Hubris (Volume 80) (Advances in Parasitology, Volume 80) (Hardcover) from BooksRun, along with many other new and used Biology books and textbooks. And, if you're looking to sell your copy, our current buyback offer is $0.3.

Description

First published in 1963, Advances in Parasitology contains comprehensive and up-to-date reviews in all areas of interest in contemporary parasitology.

Advances in Parasitology includes medical studies on parasites of major influence, such as Plasmodium falciparum and trypanosomes. The series also contains reviews of more traditional areas, such as zoology, taxonomy, and life history, which shape current thinking and applications.

Eclectic volumes are supplemented by thematic volumes on various topics, including control of human parasitic diseases and global mapping of infectious diseases. The 2010 impact factor is1.683.

  • Informs and updates on all the latest developments in the field
  • Contributions from leading authorities and industry experts
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