9780070326194-0070326193-Wire Bonding in Microelectronics: Materials, Processes, Reliability, and Yield

Wire Bonding in Microelectronics: Materials, Processes, Reliability, and Yield

ISBN-13: 9780070326194
ISBN-10: 0070326193
Edition: 2
Author: George Harman
Publication date: 1997
Publisher: McGraw-Hill Professional
Format: Hardcover 290 pages
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Book details

ISBN-13: 9780070326194
ISBN-10: 0070326193
Edition: 2
Author: George Harman
Publication date: 1997
Publisher: McGraw-Hill Professional
Format: Hardcover 290 pages

Summary

Wire Bonding in Microelectronics: Materials, Processes, Reliability, and Yield (ISBN-13: 9780070326194 and ISBN-10: 0070326193), written by authors George Harman, was published by McGraw-Hill Professional in 1997. With an overall rating of 4.5 stars, it's a notable title among other Electrical & Electronics (Engineering) books. You can easily purchase or rent Wire Bonding in Microelectronics: Materials, Processes, Reliability, and Yield (Hardcover) from BooksRun, along with many other new and used Electrical & Electronics books and textbooks. And, if you're looking to sell your copy, our current buyback offer is $4.03.

Description

The wire bonding bible - now revised and expanded! Get the practical know-how you need to design and evaluate wire bonds engineered with the latest - and still-evolving- metallurgies. Extensively revised and updated, the Second Edition of George Harman's classic Wire Bonding in Microelectronics shows you step-by-step how to exploit new higherm density interconnection techniques and engineer reliable gonds at a very high yield. You get the hands-on guidance you need to test wire bonds...clean bond pads to improve bondability and realiability...solve cratering, heel cracks, bond fatigue, so-called purple plague and other mechanical problems....bond wires to multichip modules...and much, much more. You also get up-to-the-minute details on utilizing fine pitch SMT, applying new bonding metallurgies, and exploring wire sweep and the wire bonding mechanism.

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