Sell, buy or rent Mary Ann Zaitz textbooks

9780306458033-0306458039-Advances in X-Ray Analysis, Vol. 39
9780306458033-0306458039-Advances in X-Ray Analysis, Vol. 39

Advances in X-Ray Analysis, Vol. 39

by John V. Gilfrich, I. Cev Noyan, Ron Jenkins, Ting C. Huang, Robert L. Snyder, Deane K. Smith, Mary Ann Zaitz, Paul K. Predecki
ISBN-13: 9780306458033
ISBN-10: 0306458039
Edition: 1998
Publisher: Springer
Format: Hardcover 925 pages
Sell Shop now at Amazon
cookies

We use cookies to ensure website functionality: improve our services, personalize your experience, analyze performance and traffic, and process orders efficiently. To learn more, check our Privacy Policy.