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Scanning Electron Microscopy and X-Ray Microanalysis

by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy
ISBN-13: 9781493966745
ISBN-10: 149396674X
Edition: 4th ed. 2018
Publication date: 2017
Publisher: Springer
Format: Hardcover 550 pages