Sell, buy or rent Benjamin S. Hsiao textbooks
Scattering from Polymers: Characterization by X-rays, Neutrons, and Light (ACS Symposium Series)
by
Peggy Cebe, Benjamin S. Hsiao, David J. Lohse
ISBN-13: 9780841236448
ISBN-10: 0841236445
Edition: 1
Publication date: 2000
Publisher:
American Chemical Society
Format:
Hardcover
558 pages
Degradation Processes in Nanostructured Materials: Volume 887 (MRS Proceedings)
by
Mircea Chipara, Orazio Puglisi, Ralph Skomski, Frank R. Jones, Benjamin S. Hsiao
ISBN-13: 9781107408913
ISBN-10: 1107408911
Edition: 1
Publication date: 2014
Publisher:
Cambridge University Press
Format:
Paperback
286 pages