Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences (45))

Acknowledged authors Reimer, Ludwig wrote Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences (45)) comprising 543 pages back in 1998. Textbook and eTextbook are published under ISBN 3540639764 and 9783540639763. Since then Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences (45)) textbook was available to sell back to BooksRun online for the top buyback price or rent at the marketplace.

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.