9783527334636-3527334637-Materials Characterization: Introduction to Microscopic and Spectroscopic Methods

Materials Characterization: Introduction to Microscopic and Spectroscopic Methods

ISBN-13: 9783527334636
ISBN-10: 3527334637
Edition: 2
Author: Yang Leng
Publication date: 2013
Publisher: Wiley-VCH
Format: Hardcover 392 pages
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ISBN-13: 9783527334636
ISBN-10: 3527334637
Edition: 2
Author: Yang Leng
Publication date: 2013
Publisher: Wiley-VCH
Format: Hardcover 392 pages

Summary

Materials Characterization: Introduction to Microscopic and Spectroscopic Methods (ISBN-13: 9783527334636 and ISBN-10: 3527334637), written by authors Yang Leng, was published by Wiley-VCH in 2013. With an overall rating of 4.2 stars, it's a notable title among other Materials & Material Science (Chemistry, Microscopy, Physics, Engineering) books. You can easily purchase or rent Materials Characterization: Introduction to Microscopic and Spectroscopic Methods (Hardcover) from BooksRun, along with many other new and used Materials & Material Science books and textbooks. And, if you're looking to sell your copy, our current buyback offer is $20.03.

Description

Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students.

The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content.

The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis.

The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text, the book never loses sight of its intended audience.

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