Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
ISBN-13:
9781461349693
ISBN-10:
1461349699
Edition:
3rd ed. 2003. Softcover reprint of the original 3rd ed. 2003
Author:
Joseph Goldstein, Charles E. Lyman, Dale E. Newbury, Patrick Echlin, David C. Joy, Eric Lifshin, Linda Sawyer, J.R. Michael
Publication date:
2013
Publisher:
Springer
Format:
Paperback
708 pages
Category:
Materials & Material Science
,
Engineering
FREE US shipping
Book details
ISBN-13:
9781461349693
ISBN-10:
1461349699
Edition:
3rd ed. 2003. Softcover reprint of the original 3rd ed. 2003
Author:
Joseph Goldstein, Charles E. Lyman, Dale E. Newbury, Patrick Echlin, David C. Joy, Eric Lifshin, Linda Sawyer, J.R. Michael
Publication date:
2013
Publisher:
Springer
Format:
Paperback
708 pages
Category:
Materials & Material Science
,
Engineering
Summary
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition (ISBN-13: 9781461349693 and ISBN-10: 1461349699), written by authors
Joseph Goldstein, Charles E. Lyman, Dale E. Newbury, Patrick Echlin, David C. Joy, Eric Lifshin, Linda Sawyer, J.R. Michael, was published by Springer in 2013.
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Description
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
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