Acknowledged author Joseph Goldstein wrote Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition comprising 689 pages back in 2007. Textbook and etextbook are published under ISBN 0306472929 and 9780306472923. Since then Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition textbook was available to sell back to BooksRun online for the top buyback price or rent at the marketplace.
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.