Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

ISBN-13: 9780306472923

ISBN-10: 0306472929

Author: Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael

Edition: 3rd

Publication date:
2007
Publisher:
Springer
Format:
Hardcover 689 pages
Category:
Chemistry, Radiology
 
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Summary

Acknowledged author Joseph Goldstein wrote Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition comprising 689 pages back in 2007. Textbook and etextbook are published under ISBN 0306472929 and 9780306472923. Since then Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition textbook was available to sell back to BooksRun online for the top buyback price or rent at the marketplace.


Description

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.