Sell, buy or rent Nicholas W.M. Ritchie textbooks
Scanning Electron Microscopy and X-Ray Microanalysis
by
Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy
ISBN-13: 9781493966745
ISBN-10: 149396674X
Edition: 4th ed. 2018
Publication date: 2017
Publisher:
Springer
Format:
Hardcover
573 pages
Scanning Electron Microscopy and X-Ray Microanalysis
by
Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy
ISBN-13: 9781493982691
ISBN-10: 1493982699
Edition: Softcover reprint of the original 4th ed. 2018
Publication date: 2018
Publisher:
Springer
Format:
Paperback
573 pages
