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Scanning Electron Microscopy and X-Ray Microanalysis

by Goldstein, Joseph I., Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W.M., Scott, John Henry J., Joy, David C.
ISBN-13: 9781493966745
ISBN-10: 149396674X
Edition: 4th ed. 2018
Publication date: 2017
Publisher: Springer
Format: Hardcover 573 pages